Fazle Rabbi Dayeen is a physicist with a Ph.D. in Physics from the Illinois Institute of Technology. His research focuses on thin-film and interfacial materials, advanced materials characterization, computational physics, and data-driven analysis, with growing applications in semiconductor materials, process development, and metrology.
He completed his undergraduate and master’s degrees in Physics at the University of Dhaka, where he developed a strong foundation in theoretical and computational physics. His early research involved mathematical modeling, statistical physics, and computational methods for understanding complex physical systems.
He later joined the Illinois Institute of Technology as a doctoral researcher where he expanded his research into experimental materials physics. As part of his doctoral research, he conducted experiments at Argonne National Laboratory's Advanced Photon Source, using scanning electron microscopy, synchrotron X-ray techniques to characterize thin-film and interfacial structures.
His work combines advanced materials characterization, computational analysis, and Python-based data processing to understand how nanoscale structure influences material properties, stability, and performance. He is particularly interested in applying these skills to semiconductor process engineering, thin-film metrology, advanced materials characterization, and next-generation electronic materials.